Shallow Levels Characterization in Epitaxial GaAs by Acousto-Optic Reflectance. Acta Universitaria, [S. l.], v. 15, n. 2, p. 42–49, 2005. DOI: 10.15174/au.2005.211. Disponível em: https://www.actauniversitaria.ugto.mx/index.php/acta/article/view/211. Acesso em: 20 abr. 2026.